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kasra N, esmaeeli F, Falahatgar S, etemadi B. Determination of the optical constants for Cerium-doped Vanadium pentoxide thin film from reflectance spectra. ICOP & ICPET _ INPC _ ICOFS 2015; 21 :869-872
URL: http://opsi.ir/article-1-736-en.html
URL: http://opsi.ir/article-1-736-en.html
1- guilan university
Abstract: (3743 Views)
in the present work, the calculation of thickness and optical constants of cerium doped vanadium pentoxide thin films prepared by sol-gel method on glass substrates are presented using single reflection spectra. In order to obtain a suitable fitting for reflection spectra, the classical Drude-Lorentz model has been used for the parametrized dielectric functions. The best fitting parameters for simulating of reflection spectra have been determined by Levenberg-Marquardt optimization method. The simulated reflectance from the retrieved optical constants and thickness are in good agreement with experimental data.
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