Association Mission

The mission of the association is to advance the creation, communication and application of knowledge to benefit society and improve people's lives.  

Legal Members

 

Membership

XML Persian Abstract Print


Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Ansari N, Khademi I, Tehranchi M M. Effect of Thickness on Optical properties of Permalloy . ICOP & ICPET _ INPC _ ICOFS 2015; 21 :537-540
URL: http://opsi.ir/article-1-673-en.html
1- Alzahra University
2- Shahid Beheshti University
Abstract:   (3932 Views)
Spectral ellipsometry is presented as an optical technique for measurement of refractive index and extinction coefficient. Spectral ellipsometry between 200 nm and 900 nm of optical wavelength is measured for and of permalloy layers, . Based on classical dispersion the obtained data are analyzed and is fitted for the measured wavelengths and so the effect of thickness on extinction coefficient is explored.
Full-Text [PDF 555 kb]   (1543 Downloads)    
Type of Study: Research | Subject: Special

Send email to the article author


Rights and permissions
Creative Commons License This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.

© 2025 All Rights Reserved | Optics and Photonics Society of Iran

Designed & Developed by : Yektaweb