Tantalum nanoparticles (Ta NPs) were prepared in an ethylene glycol (EG) solution by ablation with a 1064 nm Nd:YAG operating at 10 Hz. Fabricated NPs were characterized by UV-visible spectroscopy, Transmission electron microscopy, Scanning electron microscopy, X-ray diffraction, and Raman spectroscopy. The average sizes of the NPs were estimated to be in the range of 14 nm. From the UV-visible studies, the plasmon peak position of the Ta NPs was observed in the spectral range of 215 nm. The crystalline nature and phase structure of the Ta NPs were investigated using X-ray diffraction. Furthermore, for the detection and identification of molecular species absorbed at NPs surface, Raman spectroscopy analysis was performed.